Model: Does Not Apply
Condition: Used. Comes in non-original packaging. This part has minor scuffs and scratches from normal use. The photos show the exact item(s) the buyer will receive.
Notes: This part was not tested. No manuals, cords/cables, or additional items are included if not listed or shown.
- (1) Jeol Part for JSM-6400F Field Emission Scanning Electron Microscope
- Manufacturer: Jeol
- Model: Unknown
- Description: Part for JSM-6400F Field Emission Scanning Electron Microscope
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- Guaranteed to be as described
- Can be returned for flaws or malfunctions that were not disclosed
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